New device makes it possible to measure with X-ray and neutron beams simultaneously

Photo: FAU/Erich Malter

For the first time two in one

For the investigation of nanoparticles especially X-ray and neutron beams are used. FAU researchers around EAM Member Prof. Tobias Unruh, Institute for Crystallography and Structural Physics, have designed a special x-ray machine capable of studying nanoparticles in size, shape, internal structure and arrangement. The special feature: For the first time, a device has been created with which samples can be measured simultaneously with X-ray and neutron beams. The device will shortly be brought to the Institut Laue-Langevin (ILL) in Grenoble, France, where it will provide completely new answers to the world’s most powerful neutron source. On Friday, March 28, the device was officially presented at the FAU.

Prof. Dr. Tobias Unruh
Tel.: 09131/85-25189

FAU Press Release