The Center for Nanoanalysis and Electron Microscopy (CENEM) is a facility featuring cutting-edge instrumentation, techniques and expertise required for microscopic and analytical characterization of materials and devices down to the atomic scale. CENEM focuses on several complementary analysis techniques, which closely work together: Electron Microscopy, X-ray Microscopy, Cryo-TEM, Scattering Methods, Scanning Probes and Atom Probe Microscopy.
Head of Unit
Professors
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Coordination
Research associates
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CENEM Members
Dr. Benjamin Apeleo Zubiri
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Prof. Julien Bachmann (Ph. D.)
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Prof. Dr. Christoph Brabec
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Prof. Dr. Peter Felfer
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Prof. Dr. Rainer Fink
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Prof. Dr. Mathias Göken
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Prof. Dr. Danijela Gregurec
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Prof. Dr. Franziska Gröhn
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Prof. Dr. Marcus Halik
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Prof. Dr. Andreas Hirsch
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Prof. Dr. Sabine Maier
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Prof. Dr. Janina Maultzsch
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Prof. Dr. Siow Woon Ng
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Prof. Dr. Philipp Pelz
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Prof. Dr. Wolfgang Peukert
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Dr. Thomas Przybilla
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Prof. Dr. Erdmann Spiecker
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Prof. Dr. Simon Thiele
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Prof. Dr. Tobias Unruh
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Prof. Dr. Nicolas Vogel
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Dr. Johannes Walter
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Prof. Dr. Peter Wasserscheid
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Dr. Johannes Will
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